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Our Researchers
June 5, 2026
Yuka Ogino

Researcher
Master of Engineering
Research Area
- Image processing
- Image recognition
- Biometrics
Papers
First-author Publications (International Conferences)
- Ogino, Y., Toizumi, T., & Ito, A. CURVE: CLIP-Utilized Reinforcement Learning for Visual Image Enhancement via Simple Image Processing. IEEE International Conference on Image Processing (ICIP), 2025, pp. 427-432.
- Ogino, Y., Shoji, Y., Toizumi, T., & Ito, A. ERUP-YOLO: Enhancing Object Detection Robustness for Adverse Weather Condition by Unified Image-Adaptive Processing. IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 2025, pp. 8597-8605.
- Ogino, Y., Kakizaki, K., Toizumi, T., & Ito, A. Outsmarting Biometric Imposters: Enhancing Iris-Recognition System Security through Physical Adversarial Example Generation and PAD Fine-Tuning. IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), 2024, pp. 1451-1461.
- Ogino, Y., Shoji, Y., Toizumi, T., Oami, R., & Tsukada, M. Fast Eye Detector Using Siamese Network for NIR Partial Face Images. International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISAPP), 2023, pp. 419-428.
- Ogino, Y., Iida, R., & Rodemann, T. Using desirability functions for many-objective optimization of a hybrid car controller. Genetic and Evolutionary Computation Conference Companion (GECCO), 2017, pp. 297-298.
- Ogino, Y., Shibata, T., Tanaka, M., & Okutomi, M. Coaxial visible and FIR camera system with accurate geometric calibration. SPIE, Thermosense: Thermal Infrared Applications XXXIX, 2017, Vol. 10214, pp. 319-324.
- Ogino, Y., Tanaka, M., Shibata, T., & Okutomi, M. Super high dynamic range video. International Conference on Pattern Recognition (ICPR), 2016, pp. 4208-4213.
First-author Publications (Domestic Conferences)
- 荻野有加, 戸泉貴裕, 塚田正人. 虹彩認証のための高速目検出手法. 電子情報通信学会技術研究報告 (信学技報), 2023.
- 荻野有加, 蝶野慶一. 遠方からの虹彩撮像のための高速画像抽出. IEICE Conferences Archives. 電子情報通信学会, 2019.
- 荻野有加, 田中正行, 柴田剛志, 奥富正敏. 複数の長波長赤外線カメラを用いた広視野カメラシステムの開発. ロボティクス・メカトロニクス講演会講演概要集 ,2018, pp. 2A1-J06.
- 荻野有加, 柴田剛志, 田中正行, 奥富正敏. (2017). 防塵性を考慮した可視光・遠赤外線同軸カメラシステムの開発. ロボティクス・メカトロニクス講演会講演概要集, 2017, pp. 2A1-P03.
Co-authored Publications
- Otsuka, R., Shoji, Y., Ogino, Y., Toizumi, T., & Ito, A. Rethinking Image Histogram Matching For Image Classification. IEEE International Conference on Image Processing (ICIP), 2025, pp. 1235-1240.
- Ono, S., Ogino, Y., Toizumi, T., Ito, A., & Tsukada, M. Recognition-Oriented Low-Light Image Enhancement based on Global and Pixelwise Optimization. International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISAPP), 2025, pp. 222-232.
- Ono, S., Ogino, Y., Toizumi, T., Ito, A., & Tsukada, M. Improving Low-Light Image Recognition Performance Based on Image-adaptive Learnable Module. International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISAPP), 2024, pp. 721-728.
- Shoji, Y., Ogino, Y., Toizumi, T., & Ito, A. Adaptive Deep Iris Feature Extractor at Arbitrary Resolutions. IEEE International Joint Conference on Biometrics (IJCB), 2024, pp. 1-10.
- Oami, R., Sashihara, T., Sasaki, M., Akashi, R., Ogino, Y., Shoji, Y., et al. NEC's multimodal authentication terminal recognizing face and irises together. IEICE Technical Report, 2023, Vol. 123, No. 28, pp. 2-5.
- Sueishi, T., Jingu, A., Yachida, S., Inoue, M., Ogino, Y., & Ishikawa, M. Dynamic iris authentication by high-speed gaze and focus control. IEEE/SICE International Symposium on System Integration (SII), 2021, pp. 813-814.
Awards/Prizes
- IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshop on Biometrics (CVPRW2024, BIOMET) Best paper award.
Academic society, communicty, etc.
- 2025-
-
IEICE SIG-PRMU, Committee Member
- 2022
-
MIRU2022 Wakate Program Committee Member
- 2019-2023
-
IPSJ SIG-CVIM Committee Member
Patents (Issued ones only)
- US20230169793A1, Photographing system, photographing method, and non-transitory computer-readable medium storing photographing program
- EP4383192A1, Information processing device, information processing method, and storage medium
- US20230171500A1, Imaging system, imaging method, and computer program
- US12348853B2, Imaging system, imaging method, control apparatus, computer program and recording medium
- US12217542B2, Imaging system, imaging method, and non-temporary computer-readable medium storing imaging program
- US20250371909A1, Gate system
- US20230418916A1, Authentication system, authentication method, and computer readable medium
- US20240104179A1, Biometric authentication system, biometric authentication method, and recording medium
- US12087015B2, Photographing system, calibration method, and non-transitory computer-readable medium storing program
- US11936963B2, Imaging device
- US20230171481A1, Imaging system, imaging method, and computer program
- US11985432B2, Image processing device and image processing method suitably applied to biometric authentication
- US20230147924A1, Image processing system, imaging system, image processing method, and non-transitory computer-readable medium
- US20260112012A1, Imaging test chart, information processing apparatus, and information processing method
- US20250218031A1, Information processing apparatus, information processing method, and non-transitory computer readable medium
- US20250166261A1, Information processing apparatus, information processing system, information processing method, and non-transitory computer-readable medium
- US20250166261A1, Information processing apparatus, information processing system, information processing method, and non-transitory computer-readable medium
- US20240037783A1, Information processing system, information processing apparatus, information processing method, and recording medium
- US20230153409A1, Authentication system, authentication method, and program recording medium
- EP4488932A1, Information processing system, information processing method, and recording medium
Lectures
- IEEE ICIP2025 Industry Seminars, NEC and KDDI Seminar (organized by NEC and KDDI Corporations, Japan)
Academic/professional career summary
Academic
- March 2016
-
Bachelor of Control and System Engineering, Tokyo Institute of Technology (current Science Tokyo)
- March 2018
-
Master of Control and System Engineering, Tokyo Institute of Technology (current Science Tokyo)
Professional
- April 2018
-
NEC