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NEC won the Grand Prize of "Best of Show Award" in the "People's Choice" category with its system performance analysis software MasterScope Invariant Analyzer in Interop Tokyo 2010(*1). Interop Tokyo is one of the largest events for networking and computing in Asia and was held in Makuhari Messe convention center.
"MasterScope Invariant Analyzer" is the software that can detect silent faults, which are an abnormal state that cannot be detected by conventional threshold monitoring. "Invariant" means unvarying correlation between performance measures of systems at normal state and MasterScope Invariant Analyzer detects destruction of invariants as indication of silent faults. The invariant analysis technology is NEC's original technology.
As the systems go into the clouds, administration of the cloud platform and the administration of service and application which run on those platforms are often separated. Separated administration makes it difficult to detect performance degradation and isolating the cause of the performance issue. Determining whether the cause resides on the platform side or on the service side can be time and cost consuming. MasterScope Invariant Analyzer reduces time for investigating the cause of faults up to 90% and management cost under the cloud computing environment.
"People's Choice" category is chosen from all the products, solutions, and services that are nominated for the "Best of Show Award". Votes were made by visitors, who participated in any of the 3 day event. We believe that this award shows our unique product developing capability was highly appreciated by visitors.
*1:One of the largest networking and computing events in Asia and more than 300 companies participate the event. Three types of events are organized in Interop Tokyo; "ShowNet" is aiming to display best network environment that are highly demanded, "Exhibition" is displaying highlighted technologies, and "Keynotes/Conference" is aiming for deep understanding of exhibited technologies.
Venue: MAKUHARI MESSE (Chiba Japan)
Dates: Conference: Mon. June 7 - Fri. June 11. 2010
Exhibition: Mon. June 7 - Fri. June 11. 2010